Nota de aplicación
Electron microscopes designed for directly studying the surfaces of solid objects, utilizing a beam of focused electrons of relatively low energy as an electron probe that is scanned in a regular manner over the specimen. An electrical signal is obtained by collecting and amplifying secondary electrons emitted by the specimen and is applied to a cathode-ray tube scanned in synchronism with the electron beam.
Ubicación jerarquía
- Faceta Objetos
- .. Mobiliario y equipo
- .... Herramientas y equipos
- ...... equipo
- ........ <equipos por profesión o disciplina>
- .......... <equipo para ciencia y tecnología>
- ............ instrumento óptico
- .............. microscopio
- ................ microscopio electrónico
- .................. scanning electron microscopes